Work

Automatic Visual Inspection of Bump in Flip Chip using Edge Detection with Genetic Algorithm

Year: 2008

Type: article

Authors: M. Fak-aim, Anakkapon Seanton, Somyot Kaitwanidvilai

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W571879

FWCI:

Cites: 8

Cited by: 3

Related to: 10