Work

Diagrammatic key for assessment of yam leaf blight severity.

Year: 2000

Type: article

Source: Fitopatologia Brasileira

Authors: Sami Jorge Michereff, Luiz A. Maffia, M. A. Noronha

Language: English

Topic: Plant Pathogens and Fungal Diseases

Subfield: Plant Science

Field: Agricultural and Biological Sciences

Domain: Life Sciences

SDG: Zero hunger

Open Access status: diamond

OpenAlex ID: W580355871

FWCI:

Cites:

Cited by: 23

Related to: 10