Work

Effect of annealing on the crystal structure of the surface of silicon doped with Ni, Fe, and Co ions

Year: 2015

Type: article

Source: Journal of Surface Investigation X-ray Synchrotron and Neutron Techniques

DOI: 10.1134/s1027451015030222

Authors: B. E. Egamberdiev, N. T. Rustamov, A. S. Mallaev, A. M. Norov

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W608129176

FWCI:

Cites: 1

Cited by: 8

Related to: 10