Vertical Junction Under Constant Multispectral Light: Determination of Recombination Parameters
Year: 2009
Type: article
Abstract: A theoretical study of a vertical parallel junction under constant multispectral light has been made. We use a power of series method to solve the continuity equation, and determine an expression of the excess minority carrier density. The photocurrent density Jph is presented as a calibrated function, diffusion length dependent. It intercepts with the experimental short circuit current density JSC, at the minority carriers diffusion length L value. The photovoltage as a calibrated function of surface recombination velocity intercept the experimental open circuit voltage at the junction intrinsic recombination velocity.
Source: EU PVSEC
Authors: Dione, M.M., Mbodji, S., Samb, M.L., Dieng, M., Thiame, M., Ndoye, S., Barro, F.I., Sissoko, G.
Institution: Cheikh Anta Diop University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W613249521