Work

Characterization of CdTe Growth on GaAs Using Different Etching Techniques

Year: 2015

Type: article

Source: Journal of Electronic Materials

DOI: 10.1007/s11664-015-3830-5

Authors: E. Bilgilisoy, S. Özden, E. Bakali, M. Karakaya, Y. Selamet

Institution: Izmir Institute of Technology

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

Funder: İzmir Yüksek Teknoloji Enstitüsü

OpenAlex ID: W643126145

FWCI: 0.56

Cites: 16

Cited by: 11

Related to: 10