Work

Extensions of models for transistor failure probability due to neutron fluence. Technical report

Year: 1978

Type: article

Source: OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)

Authors: J. V. Michalowicz, G. A. Ausman

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W69353291

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