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Optimizing Machine Learning Classifiers for Software Defect Prediction Using GridSearchCV

Year: 2025

Type: conference-paper

Source: International Conference on NexGen Networks and Cybernetics (IC2NC)

DOI: 10.1109/ic2nc67409.2025.11376594

Authors: Sai Krishna Gunda, S Ravi Kumar

Institutions: Home Depot (United States), Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7129541007

FWCI:

Cites: 15

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Related to: 10