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A Closed-Form Solution for Fast and Reliable Adaptive Testing

Year: 2025

Type: conference-paper

Source: neural information processing systems

DOI: 10.52202/085713-3279

Authors: Yan Zhuang, Chenye Ke, Zirui Liu, Qi Liu, Yuting Ning, Zhenya Huang, Weizhe Huang, Qingyang Mao, Shijin Wang

Institutions: University of Virginia, Anhui University, University of Minnesota, Peking University, The Ohio State University, University of Science and Technology of China

Language: English

Topic: Psychometric Methodologies and Testing

Subfield: Management Science and Operations Research

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W7196992144

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