Multiscale coupled plasma–feature simulation for 3D profile evolution in Si etching under HBr/Cl2 mixture plasmas
Year: 2026
Type: article
Source: Physics of Plasmas
DOI: 10.1063/5.0333544
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G75951965
OpenAlex ID: W7201844216
