SI-Traceable Reproduction of Electric and Magnetic Field Strength Using a TEM Chamber and Dual- Probe Intercomparison
Year: 2026
Type: conference-paper
Abstract: SI-traceable realization of electromagnetic field strength is important for probe calibration and EMC measurements. Because field quantities have no direct primary standards, they must be reproduced from electrical quantities and geometry. This work presents a traceable field reproduction method using a 50-ohm TEM chamber with known septum height and measured input voltage. Electric field values were obtained with a calibrated isotropic probe, and magnetic probe measurements were converted to equivalent electric field strength using the wave impedance relationship. Voltage-based and probe-derived results were compared over frequency using deviation metrics and Bland-Altman analysis. The agreement matches the estimated uncertainty budget and confirms reliable TEM-based field reproduction and dual-probe validation.
Authors: Serhii Kursin, Oleh Velychko, Valentin Gaman
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W7202298330
