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Erasable PCM-Assisted Probe for In Situ Monitoring of Photonic Integrated Circuits

Year: 2026

Type: article

Source: ACS Photonics

DOI: 10.1021/acsphotonics.6c00749

Authors: Dongyue Sun, Mingyu Zhu, Yujun Liu, Huan Li, Daoxin Dai, Yaocheng Shi

Institution: Zhejiang University

Language: English

Topic: Photonic and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Fundamental Research Funds for the Central Universities

OpenAlex ID: W7203441925

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Cites: 21

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