High-Resolution Microwave Polarimetric Characterization Using an Electromagnetic Jet Lens
Year: 2026
Type: article
Abstract: This study proposes a local, high-resolution method for the polarimetric characterization of anisotropic samples using an electromagnetic jet lens. The jet preserves its polarization while maintaining subwavelength resolution, enabling precise delivery of a linearly polarized beam. Cross-polarization measurements confirm a polarization isolation better than −30 dB. A multizone printed circuit board (PCB) with copper lines oriented at various angles is first analyzed using the Jones formalism, and the method is then applied to a real extruded carbon-nanostructure (CNS)-loaded composite, whose anisotropy axis recovered from the measurement coincides with the known extrusion direction. Full-wave simulations and experimental results show good agreement with theoretical predictions, and the measured response is consistent with a conventional free-space measurement, confirming the effectiveness of the device for local polarimetric characterization.
Authors: Mathis Granger, Bernard Bayard, Bruno Sauviac
Institutions: Université Jean Monnet, Université Jean Monnet
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $2,645
OpenAlex ID: W7204137082