CNN surrogate model and dynamic blur exposure combined approach for edge jaggedness suppression in DMD maskless lithography
Year: 2026
Type: preprint
Source: SSRN Electronic Journal
DOI: 10.2139/ssrn.7355188
Institution: Anhui Polytechnic University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7204274723
