Year: 2026
Type: article
Abstract: The innovation demonstrates an automated system of faults in microcontrollers detection and diagnostics and provides prolonged assistance in the production line testing and maintenance. Its usage encompasses a range of microcontroller systems that make use of several units, in which substitution of entire boards create electronic waste. It will assist with an ESP32 CAM module to capture the image of the microcontroller to compare it with the test images stored on SD cards and perform physical fault checks. In case of success and a pulse is transmitted to Arduino UNO, which also checks the controller with logical errors. The UNO has a few other tests such as pin input/output and timer functions, the results of which are displayed on the Serial Monitor of the Arduino IDE. These two processes are to be integrated. Integration of these two processes not only streamlines the fault detection processes, but it promotes sustainability instead of replacing whole boards by reducing e-waste. This innovation has a higher potential to provide significant advancement in microcontroller fault detection technology and drive efficiency in electronic system management.
Source: INTI JOURNAL.
Authors: M. Ezhilarasi, Vishal Nagarajan
Institution: Sri Ramakrishna Engineering College
Language: English
Topic: Arduino and IoT Applications
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W7204474711