Work

Deep learning-based approach to mitigating reference pattern loss in digital image correlation

Year: 2026

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/aea010

Authors: Hyun-Soo Kim, Hyeon-Gyu Min, Dong-Joong Kang, Jun-Hyub Park

Institutions: Pusan National University, Kyungsung University

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7204603432

FWCI:

Cites: 30

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Related to: 10