Year: 2026
Type: article
Abstract: Ambient pressure XPS studies of atomic layer deposition of AlN show that formation of AlO x hinders formation of AlN.
Source: Journal of Materials Chemistry C
DOI: 10.1039/d6tc02829b
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Awards: G1005022168, G1696766764, G193668846, G208125138, G2156986825, G2963976641, G317939215, G3728818118, G407650637, G432129169, G4466992459, Photo-assisted atomic layer deposition in real time, G5096929151, MAX IV operations – Formas, G5224014036, G5229471624, G5434537738, G594270511, G712881263, MAX IV operations 2019-2021, G8674945231, Surface chemical mechanisms in atomic layer deposition of hard nitrides, G8693631393
OpenAlex ID: W7204806936
