Work

A Wafer Microcircuit Defect Extraction Method Based on Weighted Fusion Enhancement and Adaptive Contour Segmentation

Year: 2026

Type: article

Source: Silicon

DOI: 10.1007/s12633-026-03775-4

Authors: Tao Chen, Xianqi Liao, Duo Zou, Jiao Li, Hong Jiang, Chao Bao

Institution: Jingdezhen Ceramic Institute

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7204808065

FWCI:

Cites: 26

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Related to: 10