Reduced iodide migration in MAPI via negatively charged defects
Year: 2026
Type: article
Source: Journal of Materials Chemistry C
DOI: 10.1039/d6tc02001a
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funders: EGI, Háskólinn í Reykjavík, EEA Grants
Awards: G171794158, G5570671403, G8112847016
OpenAlex ID: W7204815593
