Test analysis of the seamless switching fault ride-through in-loop testing for transient characteristics optimization mode in low-voltage flexible interconnection system
Year: 2026
Type: article
Source: Electrical Engineering
Authors: Zikai Lu, Yan Zhou, Chi Zhang, Ying Gao
Institution: China Southern Power Grid (China)
Language: English
Subfield: Control and Systems Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7204908448
