Work

Local spectroscopy for thin film characterization using white light interferometry

Year: 2024

Type: conference-paper

Source: HAL

Authors: Gambaudo, Noémie, Twardowski, Patrice, Marbach, Sébastien, Cordier, Christophe, Jagu, Romain, Flury, Manuel

Institution: Laboratoire des Sciences de l'Ingénieur, de l'Informatique et de l'Imagerie

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7205698997

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