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顕微時間分解shg測定による強誘電性ゲート絶縁膜を用いたペンタセンfetの評価

Year: 2008

Type: conference-paper

Source: Institutional Repositories DataBase (IRDB)

Authors: 田村, 亮祐, Tamura, Ryosuke, 吉田, 周平, Yoshita, Shuhei, Lim, Eun, Lim, Eun Ju, 間中, 孝彰, Manaka, Takaaki, 岩本, 光正

Language: Japanese

Topic: Organic Electronics and Photovoltaics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7208073504

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