Work

Weakly Supervised Learning-Based Defect Detection Model for Solar Cell EL Images

Year: 2026

Type: article

Source: DOAJ (DOAJ: Directory of Open Access Journals)

DOI: 10.3969/j.issn.2096-9066.2026.04.003

Authors: Chunjuan LIU, Yixiang WANG, Xiaosuo WU

Language: Chinese

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7214101094

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