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Photonic ICs for AI Data Processing: A Primer for Electronic IC Debug and Failure Analysis Engineers

Year: 2026

Type: conference-paper

Source: Proceedings - International Symposium for Testing and Failure Analysis

DOI: 10.31399/asm.cp.istfa2026tp00j1

Authors: Chris Boit, Felix Beaudoin, Norbert Herfurth

Institutions: Technische Universität Berlin, GlobalFoundries (United States), Leibniz Institute for High Performance Microelectronics

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7214914014

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