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Electron-beam-induced damage in paint samples. Technical memo
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Year:
1976
Type:
article
Source:
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Authors:
G.L. Skillington,
D. R. Schallhorn,
W. D. Scharf,
R. B. Oswald,
Timothy R. Oldham
Language:
English
Topic:
Cultural Heritage Materials Analysis
Subfield:
Archeology (arts and humanities)
Field:
Arts and Humanities
Domain:
Social Sciences
Open Access status:
closed
OpenAlex ID:
W72363458
FWCI:
Cites:
Cited by:
Related to:
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