Work

Detector Background and Sensitivity of Semiconductor X-Ray Fluorescence Spectrometers

Year: 1972

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-1-4613-9966-7_36

Authors: F. S. Goulding, J. M. Jaklevic, B. V. Jarrett, D. A. Landis

Institution: University of California System

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W73550706

FWCI: 9.429

Cites: 4

Cited by: 29

Related to: 10