Work

Life Tests and TDDB Life Prediction Modeling of 50 nm Silicon Nitride Capacitors

Year: 2003

Type: article

Authors: Gergana I. Drandova, J.M. Beall, Kenneth D. Decker, K. Salzman

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W8226956

FWCI: 0.662

Cites: 4

Cited by: 7

Related to: 10