Work

Reliability Simulation Models for Hot Carrier Degradation

Year: 2014

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-3-319-08994-2_16

Authors: A. J. Scholten, B. De Vries, J. Bisschop, G. T. Sasse

Institution: NXP (Netherlands)

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W83165826

FWCI: 1.272

Cites: 39

Cited by: 5

Related to: 10