Three Dimensional Surface Topography Measurement by Phase Modulated Mirau Interferometeric Microscope
Year: 2014
Type: article
Source: انجمن اپتیک و فوتونیک ایران
Institution: Institute for Advanced Studies in Basic Sciences
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W8478434
