Mapping Haze Measurements: A Tool for Large Area Front Contact Optimization
Year: 2010
Type: article
Abstract: Large area (1.4 m2) thin film photovoltaic modules require precise control of the deposition uniformity. The efficiency of modules based on hydrogenated amorphous silicon (a-Si:H) and tandem modules based a- Si:H/microcrystalline silicon (μc-Si:H) can be strongly enhanced by optimizing light trapping induced by the front contact transparent conductive oxide (TCO). One of the most important parameters to quantify light trapping is the TCO haze. In this work, we present a large area mapping haze measurement system and we show how to use such a system for characterization and optimization of Zinc Oxide TCO front contacts produced by LPCVD (low pressure chemical vapour deposition). Simulations are used to show the relation between TCO coating uniformity and module performance.
Source: EU PVSEC
Authors: Losio, P.A., Roth, F., Caglar, O., Carroy, P., Bondu, B., Fattal, A., Kluth, O.
Institution: ZHAW Zurich University of Applied Sciences
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W8814031