Year: 1978
Type: article
Abstract: An opto-electronic breadboard of 10 channels of the IR temperature measuring system was produced as well as a scaled up portion of the tracking system reticle in order to verify Task 1 assumptions. The breadboards and the tests performed on them are described and both raw and reduced data are presented. Tests show that the electronics portion of the imaging system will provide a dc to 10,000 Hz bandwidth that is flat and contributes no more than 0.4% of full-scale uncertainty to the measurement. Conventional packaging is adequate for the transresistance amplifier design. Measurement errors expected from all sources tested are discussed.
Author: C. J. Chocol
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W901592009