Work

Near Field Measurement of Broad Area Laser Diodes by Utilizing Near-Field Scanning Microscope

Year: 2006

Type: article

Source: Bulletin of the American Physical Society

Authors: Soon Il Jeong, Joo In Lee, Il Ki Han, Y. C. Yoo, Kyoung Chan Kim, Jin Dong Song, Won Jun Choi, Won Jo Cho, Jung Il Lee, Si Hyung Cho, M. Dagenais

Language: English

Topic: Semiconductor Lasers and Optical Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W98339236

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