A rhombohedral ferroelectric phase in epitaxially strained Hf0.5Zr0.5O2 thin films
Work
Year: 2018
Type: article
Source: Nature Materials
Institutions University of Groningen, CentraleSupélec, Laboratoire Structures, Propriétés et Modélisation des Solides, Centre de Nanosciences et de Nanotechnologies, Université Paris-Sud +1 more
Cites: 80
Cited by: 437
Related to: 10
FWCI: 17.2
Citation percentile (by year/subfield): 100
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed