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Wen-Chieh Chen
Observed name:
W.-C. Chen
Institution:
IMEC
Observed institutions:
National Yang Ming Chiao Tung University,
National Chung Hsing University,
IMEC,
Toyota Technological Institute,
KU Leuven
ORCID:
0000-0002-1298-6693
Observed ORCID:
0000-0002-1298-6693
OpenAlex ID:
A5001109799
Quadcopter Drone for Vision-Based Autonomous Target Following
2023
·
Wen-Chieh Chen
, Chun-Liang Lin
, et al.
·
Aerospace
·
12
ESD nMOSFETs in Advanced Bulk FinFET Technology With Dual S/D Epitaxy
2022
·
Wen-Chieh Chen
, Shih-Hung Chen
, et al.
·
IEEE Transactions on Electron Devices
·
9
PDF
A 1.8-V GPIO With Design-Technology-Reliability Co-Optimization in Sub-3-nm GAA-NS Technology
2024
·
Wen-Chieh Chen
, Shih-Hung Chen
, et al.
·
IEEE Journal of Solid-State Circuits
·
7
PDF
Area-Efficient On-Chip Transient Detection Circuit for System-Level ESD Protection Against Transient-Induced Malfunction
2019
·
Wen-Chieh Chen
, Ming-Dou Ker
·
IEEE Transactions on Device and Materials Reliability
·
5
Cooperative Load Transportation of Multi-Drones Based on Disturbance Observer and Formation Control
2024
·
Wen-Chieh Chen
, Michihiro Kawanishi
, et al.
·
IEEE Access
·
4
ESD Robustness of Germanium Photodetectors in Advanced Silicon Photonics Technology
2024
·
Shih-Hung Chen
, P.-Y. Fu
, et al.
·
Annual EOS/ESD Symposium (EOS/ESD)
·
3
PDF
Methanooceanicella nereidis gen. nov., sp. nov., the first oceanic Methanocellaceae methanogen, isolated from potential methane hydrate bearing area offshore southwestern Taiwan
2024
·
Wei-Ling Zhang
, Mei-Chin Lai
, et al.
·
INTERNATIONAL JOURNAL OF SYSTEMATIC AND EVOLUTIONARY MICROBIOLOGY
·
3
New Perspective on Chiplet ESD and Dielectric Breakdown for Optimizing Protection Circuit in 2.5D/3D Bonding Technology
2025
·
Shih-Hsiang Lin
, Marko Simicic
, et al.
·
2
Ultrafast Characterization of Gated and STI Diodes in Bulk FinFET and GAAFET Technologies
2025
·
Emanuele Groppo
, Harald Gossner
, et al.
·
Annual EOS/ESD Symposium (EOS/ESD)
·
2
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs
2023
·
W.-C. Chen
, S.-H. Chen
, et al.
·
IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
·
2
On-Chip Transient Detection Circuit for Microelectronic Systems Against Electrical Transient Disturbances due to ESD Events
2018
·
Wen-Chieh Chen
, Ming-Dou Ker
·
IEEE Region 10 Symposium (TENSYMP)
·
2
ESD Challenges in 300nm Si Substrate of DTCO/STCO Scaling Options
2023
·
W.-C. Chen
, S.-H. Chen
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
1
Surge protection design with surge-to-digital converter for microelectronic circuits and systems
2018
·
Wen-Chieh Chen
, Ming-Dou Ker
·
Microelectronics Reliability
·
1
Differential Resistance Lowering Effect in High-Speed Ge Photodetectors During Nanosecond ESD Events
2026
·
Po-Yen Lin
, Marko Simicic
, et al.
·
IEEE International Reliability Physics Symposium proceedings
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Works count:
14
Citation count:
53
H-index:
4
I10-index:
1
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