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David E. Verbitsky
Observed names:
D. E. Verbitsky,
D.E. Verbitsky,
David Verbitsky
ORCID:
0000-0002-1573-9567
Observed ORCID:
0000-0002-1573-9567
OpenAlex ID:
A5001142216
Accelerated Reliability/Durability Testing as a Key Factor for Accelerated Development and Improvement of Product/Process Reliability, Durability, and Maintainability
2010
·
Lev M. Klyatis
, David Verbitsky
·
SAE technical papers on CD-ROM/SAE technical paper series
·
18
Systematic approach to modern corded telephone early commutation failure analysis
1999
·
D.E. Verbitsky
, T.N. Comerford
·
Annual Reliability and Maintainability Symposium (RAMS)
·
11
Early reliability and failure analysis of modern telephone audio systems
2003
·
D.E. Verbitsky
·
Annual Reliability and Maintainability Symposium (RAMS)
·
10
FTA technique addressing fault criticality and interactions in complex consumer communications
2002
·
D.E. Verbitsky
, P.F. Lucent
·
Annual Reliability and Maintainability Symposium (RAMS)
·
10
Early Reliability and Failure Analysis of Cordless Personal Communication Systems
2007
·
David Verbitsky
·
Annual Reliability and Maintainability Symposium (RAMS)
·
8
Wafer Reliability Evaluation and Monitoring for InGaAsP Devices
2006
·
David Verbitsky
·
IEEE International Integrated Reliability Workshop final report
·
8
Advanced FTA technique addressing early un-balanced failures of modern commercial electronic devices
2009
·
David E. Verbitsky
·
Annual Reliability and Maintainability Symposium (RAMS)
·
7
Typical super early degradation failures of mass-produced complex electronics
2011
·
David E. Verbitsky
·
Annual Reliability and Maintainability Symposium (RAMS)
·
6
FTA technique addressing parametric failures of complex electronic and hybrid devices
2005
·
D.E. Verbitsky
·
Annual Reliability and Maintainability Symposium (RAMS)
·
6
Improving Reliability and Profitability Using the Systemic Failure Analysis Methodology During Reliability Stress Testing
2012
·
David E. Verbitsky
·
SAE technical papers on CD-ROM/SAE technical paper series
·
5
Characteristic instantaneous relevant reversible failures and reliability of modern mass-produced electronics
2013
·
D. E. Verbitsky
·
Annual Reliability and Maintainability Symposium (RAMS)
·
3
Quantitative analysis and assessment of intrinsic and extrinsic factors in human-in-the-loop incidents and prevalent early failures
2018
·
David E. Verbitsky
·
International Journal of Human Factors Modelling and Simulation
·
2
Improving aerospace electronics by systemic early failure analysis during development and modification
2015
·
David E. Verbitsky
·
IEEE Aerospace Conference (AERO)
·
2
Improving Quality, Reliability and Profitability of Mobility Electronics Using Systemic Failure Mode Analysis
2014
·
David E. Verbitsky
·
SAE International journal of passenger cars. Electronic and electrical systems
·
2
Systemic Root Cause Early Failure Analysis during Accelerated Reliability Testing of Mass Produced Mobility Electronics
2016
·
David E. Verbitsky
·
SAE International Journal of Materials and Manufacturing
·
1
Practical Early Quality–Reliability Analysis of Microwirewound Resistor Transition Zone
2021
·
David E. Verbitsky
·
IEEE Transactions on Components Packaging and Manufacturing Technology
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Works count:
16
Citation count:
99
H-index:
7
I10-index:
4
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