Author

Hideaki Tanimura

Observed names: H. Tanimura, 谷村 英昭
ORCID: 0009-0005-2891-9101
Observed ORCID: 0009-0005-2891-9101
OpenAlex ID: A5001873031
2016 · Fulvio Mazzamuto, Sebastien Halty, et al. · Materials science forum · 14
2023 · Hideaki Tanimura, Yuto Ota, et al. · Japanese Journal of Applied Physics · 12
2016 · H. Tanimura, H. Kawarazaki, et al. · International Workshop on Junction Technology · 10
2017 · H. Tanimura, H. Kawarazaki, et al. · MRS Advances · 9
2024 · Hideaki Tanimura, Yuma Ueno, et al. · Japanese Journal of Applied Physics · 8
2017 · Kazuhiko Fuse, Hideaki Tanimura, et al. · International Workshop on Junction Technology · 7
2017 · Hideaki Tanimura, Kazuhiko Fuse, et al. · International Workshop on Junction Technology · 6
2004 · A. Morimoto, H. Tanimura, et al. · Applied Physics A · 5
2018 · Hideaki Tanimura, Kenji Inoue, et al. · International Workshop on Junction Technology · 3
2015 · H. Kawarazaki, H. Tanimura, et al. · International Workshop on Junction Technology · 3
2024 · Hideaki Tanimura, Yuto Ota, et al. · Japanese Journal of Applied Physics · 2
2018 · Hideaki Tanimura, Hikaru Kawarazaki, et al. · International Conference on Ion Implantation Technology · 2
2017 · Tetsuya Igo, Takahiro Higuchi, et al. · International Workshop on Junction Technology · 2
2021 · Hideaki Tanimura, Masashi Furukawa, et al. · International Workshop on Junction Technology · 1
2018 · Kazuhiko Fuse, Hideaki Tanimura, et al. · International Conference on Ion Implantation Technology · 1
2026 · Yuito Maki, Hayato Watanabe, et al. · International Conference on Solid State Devices and Materials (SSDM)
2026 · Hideaki Tanimura, Tomoya Mifune, et al. · International Conference on Solid State Devices and Materials (SSDM)
2026 · Tomoya Mifune, Hideaki Tanimura, et al. · Japanese Journal of Applied Physics
2025 · Yuma Ueno, Hideaki Tanimura, et al. · International Workshop on Junction Technology
2024 · Hideaki Tanimura, Tomoya Mifune, et al. · International Conference on Solid State Devices and Materials (SSDM)
Works count: 40
Citation count: 100
H-index: 6
I10-index: 3
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