Author

M. D. Matthews

Observed names: M.D. Matthews, Michael Matthews

Institution: AWE Nuclear Security Technologies

Observed institutions: University of California, Los Angeles, AWE Nuclear Security Technologies, Research Complex at Harwell

OpenAlex ID: A5003913926

The dynamic observation of the formation of defects in silicon under electron and proton irradiation

1973 · M. D. Matthews, S. J. Ashby · Philosophical magazine · 109

SnO2 films prepared by activated reactive evaporation

1981 · H.S. Randhawa, M.D. Matthews, et al. · Thin Solid Films · 70

Sputtering of gold foils in a high voltage electron microscope A comparison of theory and experiment

1977 · D. Cherns, M. W. Finnis, et al. · Philosophical magazine · 46

Improved profiles of electrical activity in boron implanted silicon

1968 · Miss N.G. Blamires, M.D. Matthews, et al. · Physics Letters A · 45

Electrical and electron microscopy observations on defects in ion implanted silicon

1971 · M. D. Matthews · Radiation Effects · 19

The structure of ion-implanted gold layers in single crystal silicon

1969 · M. D. Matthews, P. F. James · Philosophical magazine · 12

The formation of channelling patterns on the surface of ion bombarded silicon

1966 · R.S. Nelson, D.J. Mazey, et al. · Physics Letters · 8

Electrical and electron microscope observations on antimony-implanted silicon

1969 · M. D. Matthews · Journal of Materials Science · 6

Acceptor profiles in silicon implanted with boron at 77°K

1971 · M.D. Matthews · Physics Letters A · 3

A simple method for the approximate calculation of electron ranges in media

1980 · M. D. Matthews · Radiation Effects · 1

On approximate methods for calculating ion energy deposition profiles

1976 · M. D. Matthews · Radiation Effects · 1

WDS-SD Can Improve our Understanding of the Physics of the WDS Spectrometer Allowing the Development of New Designs

2026 · Patrick Camus, Ken Moran, et al. · Microscopy and Microanalysis

Works count: 12

Citation count: 320

H-index: 7

I10-index: 6