Author

Alexander Sieck

2003 · A. Sieck, Th. Frauenheim, et al. · physica status solidi (b) · 93
1997 · A. Sieck, D. Porezag, et al. · Physical Review A · 90
2006 · W. Mueller, G. Aichmayr, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 89
2002 · T.E.M. Staab, A. Sieck, et al. · Physical review. B, Condensed matter · 68
2001 · Paola Alippi, L. Colombo, et al. · Physical review. B, Condensed matter · 47
2014 · H. Figgemeier, M. Benecke, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 45
1999 · T.E.M. Staab, M. Haugk, et al. · Physica B Condensed Matter · 29
1999 · R. Gutierrez, M. Haugk, et al. · Physical review. B, Condensed matter · 20
2018 · Rainer Breiter, Matthias Benecke, et al. · 18
2016 · R. Breiter, M. Benecke, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 18
1997 · Th. Frauenheim, D. Porezag, et al. · MRS Proceedings · 18
2000 · H S Leipner, C G Hübner, et al. · Journal of Physics Condensed Matter · 16
1998 · Peter Deák, Adam Gali, et al. · Materials science forum · 16
2018 · A. Sieck, M. Benecke, et al. · Journal of Electronic Materials · 15
2018 · Frank Rutz, Rolf Aidam, et al. · Electro-Optical and Infrared Systems: Technology and Applications · 14
2020 · Marco Vallone, Michele Goano, et al. · Applied Optics · 12
2002 · M. Streibl, Kai Esmark, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 12
2019 · D. Eich, C. Ames, et al. · Journal of Electronic Materials · 11
2018 · Christopher Ames, Rainer Breiter, et al. · 11
2006 · T. Tran, R. Weis, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 8
2003 · M. Streibl, K. Esmark, et al. · Microelectronics Reliability · 8
2016 · Frank Rutz, Philipp Kleinow, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2016 · A. Weber, M. Benecke, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2015 · F. Rutz, P. Kleinow, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
1997 · Peter Deák, Adam Gali, et al. · Materials science forum · 7
Works count: 44
Citation count: 740
H-index: 14
I10-index: 19
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