Author

M. Roellig

2011 · Andre Striegler, Bernd Koehler, et al. · Ultramicroscopy · 52
2008 · S. Wiese, M. Roellig, et al. · Microelectronics Reliability · 50
2007 · M. Mueller, S. Wiese, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 46
2006 · Mike Roellig, Rainer Dudek, et al. · Microelectronics Reliability · 36
2003 · S. Pinel, S. Chakraborty, et al. · IEEE MTT-S International Microwave Symposium digest · 35
2023 · Darshankumar Bhat, Stefan Muench, et al. · e-Prime - Advances in Electrical Engineering Electronics and Energy · 30
2014 · A. Kabakchiev, B. Metais, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 22
2008 · Rainer Dudek, Wolfgang Faust, et al. · I-THERM :/I-THERM - Intersociety Conference on Thermal Phenomena in Electronic Systems · 22
2006 · S. Wiese, M. Roellig, et al. · Electronic System-Integration Technology Conference (ESTC) · 21
2022 · S. Muench, D. Bhat, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 18
2014 · Karsten Meier, Mike Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 18
2007 · Maik Mueller, Steffen Wiese, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 18
2005 · S. Wiese, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 18
2005 · S. Wiese, M. Roellig, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 18
2007 · Rainer Dudek, Wolfgang Faust, et al. · IEEE Electronics Packaging Technology Conference (EPTC) · 16
2020 · Lili Chen, Ulana Cikalova, et al. · Journal of sensors and sensor systems · 15
2011 · Karsten Meier, Mike Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 15
2019 · K. Meier, D. Leslie, et al. · IEEE Electronics Packaging Technology Conference (EPTC) · 14
2014 · R. Metasch, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 14
2018 · R. Schwerz, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 13
2007 · Mike Rollig, Steffen Wiese, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 13
2018 · F. Kraemer, M. Roellig, et al. · Microelectronics Reliability · 12
2014 · R. Schwerz, M. Roellig, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 12
2010 · Mike Roellig, Rene Metasch, et al. · Electronic System-Integration Technology Conference (ESTC) · 12
Works count: 108
Citation count: 891
H-index: 15
I10-index: 30
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