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Author

Keno Sato

Observed names: K. Sato, K.F. Sato, Sato Keno
Institution: ROHM
ORCID: 0009-0001-9069-6413
Observed ORCID: 0009-0001-9069-6413
OpenAlex ID: A5006643454
Analog/Mixed-Signal Circuit Testing Technologies in IoT Era
2020 · Haruo Kobayashi, Anna Kuwana, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 18
Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method
2021 · Shuhei Yamamoto, Yuto Sasaki, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 12
Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration
2022 · Shuhei Yamamoto, Yuto Sasaki, et al. · IEEE Transactions on Device and Materials Reliability · 10
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion
2019 · Yuto Sasaki, Tamotsu Ichikawa, et al. · IEEE International Test Conference in Asia (ITC-Asia) · 9
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
2022 · Yujie Zhao, Kentaroh Katoh, et al. · Journal of Electronic Testing · 8
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies
2021 · Keno Sato, Takashi Ishida, et al. · IEEE International Test Conference (ITC) · 8
Low-frequency noise in GaAs and InP Schottky diodes
2002 · K.F. Sato, C.W. Chan, et al. · IEEE MTT-S International Microwave Symposium digest · 8
Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion
2023 · Keno Sato, Takayuki Nakatani, et al. · IEEE International Test Conference (ITC) · 6
Accurate Testing of Precision Voltage Reference by DC-AC Conversion
2020 · Keno Sato, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 6
A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation
2023 · Kentaroh Katoh, Shuhei Yamamoto, et al. · IEEE International Test Conference in Asia (ITC-Asia) · 5
Evaluation of Code Selective Histogram Algorithm For ADC Linearity Test
2022 · Yujie Zhao, Kentaroh Katoh, et al. · IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) · 5
Evaluation of Null Method for Operational Amplifier Short-Time Testing
2019 · Riho Aoki, Shogo Katayama, et al. · IEEE International Conference on ASIC (ASICON) · 5
Single amplifier loop filter circuit for oversampling A/D converter
2002 · S. Hirano, K. Sato, et al. · IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) · 5
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers
2020 · Gaku Ogihara, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 4
Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing
2022 · Shogo Katayama, Takayuki Nakatani, et al. · IEICE Electronics Express · 3
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Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production
2021 · Gaku Ogihara, Takayuki Nakatani, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 3
Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method
2021 · Yujie Zhao, Anna Kuwana, et al. · International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) · 3
1/f noise modeling of InP HBT-based Schottky diodes for monolithic monolithic millimeter-wave mixers
2002 · Y.H. Chung, K.F. Sato, et al. · IEEE MTT-S International Microwave Symposium digest · 3
Optimization of Input and Sampling Frequencies for Accurate ADC Dynamic Testing Using Incoherent Sampling
2026 · Keno Sato, Toshiyuki Okamoto, et al. · IEEE Transactions on Instrumentation and Measurement · 2
Design Consideration for LC Analog Filters: Inductor ESR Compensation, Mutual Inductance Effect and Variable Center Frequency
2023 · Misaki Takagi, Takayuki Nakatani, et al. · Lecture notes in networks and systems · 2
12 bit 1 ps Resolution Time-to-Digital Converter for LSI Test System
2023 · Daisuke Iimori, Takayuki Nakatani, et al. · Lecture notes in networks and systems · 2
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
2022 · Keno Sato, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 2
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm
2019 · Jiang-Lin Wei, Nene Kushita, et al. · IEEE International Conference on ASIC (ASICON) · 2
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment
2021 · Keno Sato, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 1
Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer
2021 · Daisuke Iimori, Takayuki Nakatani, et al. · IEEE International Test Conference (ITC) · 1
Works count: 33
Citation count: 134
H-index: 7
I10-index: 3
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