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Andrzej J. Strojwas

Observed names: A. J. Strojwas, A. Strojwas, A.J. Strojwas, Andrzej Strojwas, Andrzej Strójwąs, Prof Andrzej Strojwas, Strojwas, Andrzej J.
Observed institutions: Toshiba (Japan), IBM (United States), Jan Kochanowski University, Advanced Micro Devices (United States), PDF Solutions (United States), Carnegie Mellon University
ORCID: 0000-0001-9549-0302
Observed ORCID: 0000-0001-9549-0302
OpenAlex ID: A5008759589
Correlation-aware statistical timing analysis with non-Gaussian delay distributions
2005 · Y. Zhan, A.J. Strojwas, et al. · ACM/IEEE Design Automation Conference (DAC) · 171
VLSI Yield Prediction and Estimation: A Unified Framework
1986 · W. Maly, A.J. Strojwas, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 150
Model order-reduction of RC(L) interconnect including variational analysis
1999 · Ying Liu, L.T. Pileggi, et al. · ACM/IEEE Design Automation Conference (DAC) · 143
FABRICS II: A Statistically Based IC Fabrication Process Simulator
1984 · S.R. Nassif, A.J. Strojwas, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 133
Impact of interconnect variations on the clock skew of a gigahertz microprocessor
2000 · Ying Liu, Sani R. Nassif, et al. · ACM/IEEE Design Automation Conference (DAC) · 124
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Exploring regular fabrics to optimize the performance-cost trade-off
2003 · L. Pileggi, H. Schmit, et al. · ACM/IEEE Design Automation Conference (DAC) · 116
A Methodology for Worst-Case Analysis of Integrated Circuits
1986 · S.R. Nassif, A.J. Strojwas, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 109
Co-Optimization of Circuits, Layout and Lithography for Predictive Technology Scaling Beyond Gratings
2010 · Tejas Jhaveri, Vyacheslav Rovner, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 98
VLSI Design for Manufacturing: Yield Enhancement
1990 · Stephen W. Director, Wojciech Maly, et al. · Kluwer international series in engineering and computer science · 98
Computer-Aided Manufacturing
1990 · Stephen W. Director, Wojciech Maly, et al. · Kluwer international series in engineering and computer science · 97
Design methodology for IC manufacturability based on regular logic-bricks
2005 · V. Kheterpal, V. Rovner, et al. · ACM/IEEE Design Automation Conference (DAC) · 90
Efficient and rigorous three-dimensional model for optical lithography simulation
1996 · Kevin D. Lucas, Hiroyoshi Tanabe, et al. · Journal of the Optical Society of America A · 72
Statistical Simulation of the IC Manufacturing Process
1982 · W. Maly, A.J. Strojwas · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 72
In-line defect sampling methodology in yield management: an integrated framework
1996 · R.K. Nurani, R. Akella, et al. · IEEE Transactions on Semiconductor Manufacturing · 61
Maximization of layout printability/manufacturability by extreme layout regularity
2007 · Tejas K. Jhaveri, Vyacheslav Rovner, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 58
Projection-based performance modeling for inter/intra-die variations
2005 · Xin Li, Jiayong Le, et al. · 54
In-line yield prediction methodologies using patterned wafer inspection information
1998 · R.K. Nurani, A.J. Strojwas, et al. · IEEE Transactions on Semiconductor Manufacturing · 51
Maximization of layout printability/manufacturability by extreme layout regularity
2006 · Tejas Jhaveri, Larry Pileggi, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 43
Using spatial information to analyze correlations between test structure data (semiconductor IC manufacture)
1991 · J.K. Kibarian, A. Strojwas · IEEE Transactions on Semiconductor Manufacturing · 41
A New Approach to Hierarchical and Statistical Timing Simulations
1987 · J. Benkoski, A.J. Strojwas · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 37
Projection-based performance modeling for inter/intra-die variations
2005 · Xin Li, Jiayong Le, et al. · International Conference on Computer Aided Design · 36
Path delay fault diagnosis and coverage-a metric and an estimation technique
2001 · M. Sivaraman, A.J. Strojwas · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 36
Perspectives on technology and technology-driven CAD
2000 · R.W. Dutton, A.J. Strojwas · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 36
Influence of oxide thickness nonuniformities on the tunnel current-voltage and capacitance-voltage characteristics of the metal-oxide-semiconductor system
1993 · Bogdan Majkusiak, Andrzej Strojwas · Journal of Applied Physics · 36
The Overview of Silicon Carbide Technology: Status, Challenges, Key Drivers, and Product Roadmap
2024 · Maciej Kamiński, Krystian Król, et al. · Materials · 34
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Works count: 265
Citation count: 3,626
H-index: 31
I10-index: 89
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