Get started
Author

Toshiyuki Okamoto

Institution: ROHM
ORCID: 0009-0008-8041-9421
Observed ORCID: 0009-0008-8041-9421
OpenAlex ID: A5009609514
Analog/Mixed-Signal Circuit Testing Technologies in IoT Era
2020 · Haruo Kobayashi, Anna Kuwana, et al. · IEEE International Conference on Solid-State and Integrated Circuit Technology · 18
Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method
2021 · Shuhei Yamamoto, Yuto Sasaki, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 12
Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration
2022 · Shuhei Yamamoto, Yuto Sasaki, et al. · IEEE Transactions on Device and Materials Reliability · 10
Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion
2019 · Yuto Sasaki, Tamotsu Ichikawa, et al. · IEEE International Test Conference in Asia (ITC-Asia) · 9
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies
2022 · Yujie Zhao, Kentaroh Katoh, et al. · Journal of Electronic Testing · 8
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies
2021 · Keno Sato, Takashi Ishida, et al. · IEEE International Test Conference (ITC) · 8
Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion
2023 · Keno Sato, Takayuki Nakatani, et al. · IEEE International Test Conference (ITC) · 6
Accurate Testing of Precision Voltage Reference by DC-AC Conversion
2020 · Keno Sato, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 6
A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation
2023 · Kentaroh Katoh, Shuhei Yamamoto, et al. · IEEE International Test Conference in Asia (ITC-Asia) · 5
Evaluation of Code Selective Histogram Algorithm For ADC Linearity Test
2022 · Yujie Zhao, Kentaroh Katoh, et al. · IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) · 5
Evaluation of Null Method for Operational Amplifier Short-Time Testing
2019 · Riho Aoki, Shogo Katayama, et al. · IEEE International Conference on ASIC (ASICON) · 5
Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers
2020 · Gaku Ogihara, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 4
Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing
2022 · Shogo Katayama, Takayuki Nakatani, et al. · IEICE Electronics Express · 3
PDF
Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production
2021 · Gaku Ogihara, Takayuki Nakatani, et al. · IEEE International Conference on Electronics, Circuits and Systems (ICECS) · 3
Input Signal and Sampling Frequencies Requirements for Efficient ADC Testing with Histogram Method
2021 · Yujie Zhao, Anna Kuwana, et al. · International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC) · 3
Optimization of Input and Sampling Frequencies for Accurate ADC Dynamic Testing Using Incoherent Sampling
2026 · Keno Sato, Toshiyuki Okamoto, et al. · IEEE Transactions on Instrumentation and Measurement · 2
Design Consideration for LC Analog Filters: Inductor ESR Compensation, Mutual Inductance Effect and Variable Center Frequency
2023 · Misaki Takagi, Takayuki Nakatani, et al. · Lecture notes in networks and systems · 2
12 bit 1 ps Resolution Time-to-Digital Converter for LSI Test System
2023 · Daisuke Iimori, Takayuki Nakatani, et al. · Lecture notes in networks and systems · 2
High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
2022 · Keno Sato, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 2
High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm
2019 · Jiang-Lin Wei, Nene Kushita, et al. · IEEE International Conference on ASIC (ASICON) · 2
A Stable 4th-Order Delta-Sigma Modulator with an FIR predictor
1992 · Toshiyuki Okamoto, Yuichi Maruyama, et al. · European Solid-State Circuits Conference (ESSCIRC) · 2
High Precision Measurement of Sub-Nano Ampere Current in ATE Environment
2021 · Keno Sato, Takayuki Nakatani, et al. · Proceedings - Asian Test Symposium/Proceedings · 1
Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer
2021 · Daisuke Iimori, Takayuki Nakatani, et al. · IEEE International Test Conference (ITC) · 1
Innovative Test Practices in Japan
2019 · Yusuke Asada, Takahiko Shimizu, et al. · IEEE VLSI Test Symposium (VTS) · 1
Hardware-Efficient Low-Distortion Sinusoidal Signal Generator Using FPGA-Based Dual-DAC Digital Predistortion
2026 · Keno Sato, Takayuki Nakatani, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Works count: 29
Citation count: 120
H-index: 6
I10-index: 3
Year
Topic
Type