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Manuel Kasper

Observed names: Kasper, Manuel, M Kasper, M. Kasper
ORCID: 0000-0002-6143-2881
Observed ORCID: 0000-0002-6143-2881
OpenAlex ID: A5011611005
Calibrated complex impedance and permittivity measurements with scanning microwave microscopy
2014 · G Gramse, M Kasper, et al. · Nanotechnology · 161
Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy
2015 · Enrico Brinciotti, Georg Gramse, et al. · Nanoscale · 69
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Quantitative sub-surface and non-contact imaging using scanning microwave microscopy
2015 · Georg Gramse, Enrico Brinciotti, et al. · Nanotechnology · 61
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Electrochemical impedance spectroscopy error analysis and round robin on dummy cells and lithium-ion-batteries
2022 · Manuel Kasper, Arnd Leike, et al. · Journal of Power Sources · 49
Assessment of lithium ion battery ageing by combined impedance spectroscopy, functional microscopy and finite element modelling
2021 · Nawfal Al-Zubaidi R-Smith, Michael Leitner, et al. · Journal of Power Sources · 48
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Calibrated complex impedance of CHO cells andE.colibacteria at GHz frequencies using scanning microwave microscopy
2016 · Silviu-Sorin Tuca, Giorgio Badino, et al. · Nanotechnology · 47
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Measurement Uncertainty in Battery Electrochemical Impedance Spectroscopy
2022 · Amin Moradpour, Manuel Kasper, et al. · IEEE Transactions on Instrumentation and Measurement · 44
High-Potential Test for Quality Control of Separator Defects in Battery Cell Production
2021 · Louisa Hoffmann, Manuel Kasper, et al. · Batteries · 36
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Fast method for calibrated self-discharge measurement of lithium-ion batteries including temperature effects and comparison to modelling
2023 · Nawfal Al-Zubaidi R-Smith, Manuel Moertelmaier, et al. · Energy Reports · 34
Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale
2014 · A. O. Oladipo, A. Lucibello, et al. · Applied Physics Letters · 24
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Broadband 120 MHz Impedance Quartz Crystal Microbalance (QCM) with Calibrated Resistance and Quantitative Dissipation for Biosensing Measurements at Higher Harmonic Frequencies
2016 · Manuel Kasper, Lukas Traxler, et al. · Biosensors · 22
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Interferometer Scanning Microwave Microscopy: Performance Evaluation
2017 · Silviu-Sorin Tuca, Manuel Kasper, et al. · IEEE Transactions on Nanotechnology · 20
Metal-oxide-semiconductor capacitors and Schottky diodes studied with scanning microwave microscopy at 18 GHz
2014 · M. Kasper, G. Gramse, et al. · Journal of Applied Physics · 20
Multiplexed 16 × 16 Li-Ion Cell Measurements Including Internal Resistance for Quality Inspection and Classification
2021 · Nawfal Al-Zubaidi R-Smith, Mykolas Ragulskis, et al. · IEEE Transactions on Instrumentation and Measurement · 19
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Calibrated Electrochemical Impedance Spectroscopy and Time‐Domain Measurements of a 7 kWh Automotive Lithium‐Ion Battery Module with 396 Cylindrical Cells
2022 · Manuel Kasper, Manuel Moertelmaier, et al. · Batteries & Supercaps · 16
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Three-dimensional finite-element simulations of a scanning microwave microscope cantilever for imaging at the nanoscale
2013 · A. O. Oladipo, M. Kasper, et al. · Applied Physics Letters · 15
Optimization of the imaging response of scanning microwave microscopy measurements
2015 · G. M. Sardi, A. Lucibello, et al. · Applied Physics Letters · 13
A broadband toolbox for scanning microwave microscopy transmission measurements
2016 · Andrea Lucibello, Giovanni Maria Sardi, et al. · Review of Scientific Instruments · 12
Advanced Electrochemical Impedance Spectroscopy of Industrial Ni-Cd Batteries
2022 · Nawfal Al-Zubaidi R-Smith, Manuel Kasper, et al. · Batteries · 11
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Frequency Analysis of Dopant Profiling and Capacitance Spectroscopy using Scanning Microwave Microscopy
2016 · Enrico Brinciotti, Giulio Campagnaro, et al. · IEEE Transactions on Nanotechnology · 10
Advanced Self-Discharge Measurements of Lithium-Ion Cells and Comparison to Modeling
2020 · Nawfal Al-Zubaidi R-Smith, Georg Gramse, et al. · IEEE International Instrumentation and Measurement Technology Conference · 8
Semiconductor Material and Device Characterization via Scanning Microwave Microscopy
2013 · Hassan Tanbakuchi, Ferry Kienberger, et al. · Technical digest -- IEEE Compound Semiconductor Integrated Circuit Symposium · 8
Transmission and reflection mode scanning microwave microscopy (SMM): Experiments, calibration, and simulations
2015 · Pablo F. Medina, Andrea Lucibello, et al. · European Microwave Conference (EuMC) · 7
Corrigendum: Calibrated complex impedance and permittivity measurements with scanning microwave microscopy (2014 Nanotechnology 25 145703)
2015 · G Gramse, M Kasper, et al. · Nanotechnology · 7
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Electrochemical Impedance Spectroscopy Accuracy and Repeatability Analysis of 10 kWh Automotive Battery Module
2025 · Manuel Kasper, Arnd Leike, et al. · Batteries · 6
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Works count: 62
Citation count: 795
H-index: 15
I10-index: 20
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