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Olivier Simonetti

Observed names: O Simonetti, O. SIMONETTI, O. Simonetti, Simonetti, O., Simonetti, Olivier
ORCID: 0000-0002-7614-2705
Observed ORCID: 0000-0002-7614-2705
OpenAlex ID: A5013528762
Organic transistor model with nonlinear injection: Effects of uneven source contact on apparent mobility and threshold voltage
2010 · O. Simonetti, L. Giraudet, et al. · Organic Electronics · 43
New anthracene-based soluble polymers: optical and charge carrier transport properties
2013 · Haikel Hrichi, Khaled Hriz, et al. · Journal of Polymer Research · 36
Characterizations of Ohmic and Schottky-behaving contacts of a single ZnO nanowire
2013 · Bogdan Bercu, Wei Geng, et al. · Nanotechnology · 32
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Threshold voltage and turn-on voltage in organic transistors: Sensitivity to contact parasitics
2010 · L. Giraudet, O. Simonetti · Organic Electronics · 31
Transport models in disordered organic semiconductors and their application to the simulation of thin‐film transistors
2019 · Olivier Simonetti, Louis Giraudet · Polymer International · 30
High voltage surface potential measurements in ambient conditions: Application to organic thin-film transistor injection and transport characterization
2016 · Grégoire de Tournadre, Frédéric Reisdorffer, et al. · Journal of Applied Physics · 26
Parametrization of the Gaussian Disorder Model to Account for the High Carrier Mobility in Disordered Organic Transistors
2021 · Yongjeong Lee, Sungyeop Jung, et al. · Physical Review Applied · 25
Low voltage stress induced leakage currents and surface states in ultrathin (1.2–2.5 nm) oxides
2002 · A. Meinertzhagen, C. Petit, et al. · Journal of Applied Physics · 25
Tailoring the microstructure and charge transport in conjugated polymers by alkyl side-chain engineering
2015 · Sadiara Fall, Laure Biniek, et al. · Journal of Materials Chemistry C · 24
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Spin-coated conductive polymer film resistivity measurement using the TLM method
2006 · L. Giraudet, S. Fauveaux, et al. · Synthetic Metals · 24
Characterization of ultrathin metal–oxide–semiconductor structures using coupled current and capacitance–voltage models based on quantum calculation
2002 · O. Simonetti, T. Maurel, et al. · Journal of Applied Physics · 22
Experimental determination of the lateral resolution of surface electric potential measurements by Kelvin probe force microscopy using biased electrodes separated by a nanoscale gap and application to thin-film transistors
2022 · Mélanie Brouillard, Nicolas Bercu, et al. · Nanoscale Advances · 18
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Ohmic contact on single ZnO nanowires grown by MOCVD
2013 · Wei Geng, Sergei Kostcheev, et al. · Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics · 17
Low voltage SILC and P- and N-MOSFET gate oxide reliability
2004 · C. Petit, A. Meinertzhagen, et al. · Microelectronics Reliability · 16
Si – SiO 2 barrier height and its temperature dependence in metal-oxide-semiconductor structures with ultrathin gate oxide
2002 · A. Hadjadj, O. Simonetti, et al. · Applied Physics Letters · 15
Extraction of the oxide thickness using a MOS structure quantum model for SiO2 oxide <5 nm thick films
2001 · O. Simonetti, T. Maurel, et al. · Journal of Non-Crystalline Solids · 15
Effective mobility in amorphous organic transistors: Influence of the width of the density of states
2013 · Olivier Simonetti, Louis Giraudet, et al. · Organic Electronics · 13
Generation-recombination in disordered organic semiconductor: Application to the characterization of traps
2021 · Ndèye Saly Ndiaye, Olivier Simonetti, et al. · Organic Electronics · 12
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Development of an improved Kelvin probe force microscope for accurate local potential measurements on biased electronic devices
2017 · N.B. BERCU, L. GIRAUDET, et al. · Journal of Microscopy · 10
Sub-threshold current in organic thin film transistors: Influence of the transistor layout
2013 · Olivier Simonetti, Louis Giraudet · Organic Electronics · 7
KPFM - Raman Spectroscopy Coupled Technique for the Characterization of Wide Bandgap Semiconductor Devices
2022 · Nicolas Bercu, Mihai Lazar, et al. · Materials science forum · 5
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Stress-induced leakage current at low field in NMOS and PMOS devices with ultra-thin nitrided gate oxide
2004 · M Fadlallah, G Ghibaudo, et al. · Microelectronic Engineering · 5
An Interfacial Additional Organic Semiconductor Layer for Enhanced Charge Injection in Top-Contact Organic Transistors
2026 · Haobing Wang, Olivier Simonetti, et al. · ACS Applied Electronic Materials · 2
Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices
2003 · M. Fadlallah, C. Petit, et al. · Microelectronics Reliability · 2
Effect of boron neutralization on interface state creation after direct tunneling injections at 100 °C in 2,3-nm ultrathin gate oxides
2003 · D. Zander, J. Boch, et al. · Applied Physics Letters · 2
Works count: 43
Citation count: 460
H-index: 15
I10-index: 19
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