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Xinli Gu

Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting
2013 · Fangming Ye, Zhaobo Zhang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 102
Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning
2014 · Fangming Ye, Zhaobo Zhang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 67
A new approach to scan chain reordering using physical design information
2002 · M. Hirech, J. Beausang, et al. · IEEE International Test Conference (ITC) · 47
Design for Board and System Level Structural Test and Diagnosis
2006 · Toai Vo, Zhiyuan Wang, et al. · IEEE International Test Conference (ITC) · 44
Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes
2015 · Shi Jin, Fangming Ye, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 39
VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG
2008 · Laung-Terng Wang, Xiaoqing Wen, et al. · IEEE Design & Test of Computers · 39
A practical perspective on reducing ASIC NTFs
2006 · Z. Conroy, G. Richmond, et al. · IEEE International Test Conference (ITC) · 38
Testability analysis and improvement from VHDL behavioral specifications
1994 · Xinli Gu, Krzysztof Kuchciński, et al. · European Design Automation Conference · 36
Testability analysis and improvement in high-level synthesis systems
1992 · Xinli Gu · 36
Board-level fault diagnosis using Bayesian inference
2010 · Zhaobo Zhang, Zhanglei Wang, et al. · IEEE VLSI Test Symposium (VTS) · 34
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks
2011 · Zhaobo Zhang, Krishnendu Chakrabarty, et al. · IEEE International Test Conference (ITC) · 30
Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees
2012 · Fangming Ye, Zhaobo Zhang, et al. · Proceedings - Asian Test Symposium/Proceedings · 29
Re-using DFT logic for functional and silicon debugging test
2003 · Xinli Gu, Weili Wang, et al. · IEEE International Test Conference (ITC) · 28
Accurate anomaly detection using correlation-based time-series analysis in a core router system
2016 · Shi Jin, Zhaobo Zhang, et al. · IEEE International Test Conference (ITC) · 23
Black-Box Test-Cost Reduction Based on Bayesian Network Models
2020 · Renjian Pan, Zhaobo Zhang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 22
Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees
2015 · Fangming Ye, Zhaobo Zhang, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 22
Diagnostic system based on support-vector machines for board-level functional diagnosis
2012 · Zhaobo Zhang, Xinli Gu, et al. · IEEE European Test Symposium (ETS) · 22
Board-Level Functional Fault Identification Using Streaming Data
2020 · Mengyun Liu, Fangming Ye, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 20
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis
2014 · Fangming Ye, Zhaobo Zhang, et al. · IEEE International Test Conference (ITC) · 18
Board-Level Functional Fault Identification using Streaming Data
2019 · Mengyun Liu, Fangming Ye, et al. · IEEE VLSI Test Symposium (VTS) · 16
Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster–Shafer Theory
2012 · Hongxia Fang, Krishnendu Chakrabarty, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 16
Fine-Grained Adaptive Testing Based on Quality Prediction
2018 · Mengyun Liu, Renjian Pan, et al. · IEEE International Test Conference (ITC) · 15
Changepoint-based anomaly detection in a core router system
2017 · Shi Jin, Zhaobo Zhang, et al. · IEEE International Test Conference (ITC) · 15
AgentDiag: An agent-assisted diagnostic framework for board-level functional failures
2013 · Zelong Sun, Li Jiang, et al. · IEEE International Test Conference (ITC) · 14
Physical defect modeling for fault insertion in system reliability test
2009 · Zhaobo Zhang, Zhanglei Wang, et al. · IEEE International Test Conference (ITC) · 14
Works count: 91
Citation count: 1,092
H-index: 18
I10-index: 39
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