Author

T. H. Yang

2012 · M McKague, T H Yang, et al. · Journal of Physics A Mathematical and Theoretical · 251
2008 · B. Lee, Y. H. Lee, et al. · International Journal of Production Research · 28
2008 · Hang-Ting Lue, Erh-Kun. Lai, et al. · Symposium on VLSI Technology · 20
2006 · S. L. Hsieh, Feipei Lai, et al. · Conference proceedings · 20
2008 · Hang-Ting Lue, Tzu-Hsuan Hsu, et al. · Symposium on VLSI Technology · 13
2007 · H J Lee, C H Lee, et al. · Semiconductor Science and Technology · 11
2021 · Weilun Ciou, Tony Hu, et al. · SPIE Optical Microlithography · 9
2016 · Chi-hao Huang, Mars Yang, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2010 · S. H. Black, R. Kraft, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
2020 · T. H. Yang, Z Liu, et al. · UTS ePRESS (University of Technology Sydney) · 6
2010 · L. W. Chen, Mars Yang, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 6
2008 · Wei-Chih Chien, Erh-Kun Lai, et al. · IEEE International Power Modulator Symposium and High-Voltage Workshop (IPMHVC) · 5
2022 · Wei-Hung Wang, Irina Brinster, et al. · Metrology, Inspection, and Process Control XXXVI · 4
2017 · Chi-hao Huang, Yu-Lin Liu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2013 · Chih-Chieh Yu, C. C. Yang, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4
2021 · Yu-Lin Liu, Li-Ting Chang, et al. · Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV · 3
2017 · Chi-hao Huang, Yu-Lin Liu, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2017 · C. J. Tu, C. H. Huang, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2015 · Fengnien Tsai, Teng-hao Yeh, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2006 · C.-L. Fan, T.-H. Yang · Electrochemical and Solid-State Letters · 2
2025 · Weilun Chiu, Tony Hu, et al. · DTCO and Computational Patterning · 1
2024 · Lei Fan, E. Zhang, et al. · International Journal of Electrochemical Science · 1
2018 · ChengHuei Lin, C.M. Hu, et al. · SPIE Optical Microlithography · 1
Works count: 39
Citation count: 419
H-index: 7
I10-index: 6
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