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John Y. Chen
Observed name:
JOHN Y. CHEN
Institutions:
Nvidia (United States),
Stanford University
Observed institutions:
Boeing (United States),
Palo Alto Research Center,
HRL Laboratories (United States),
Nvidia (United States),
University of Maryland, College Park,
Stanford University
show all 6
OpenAlex ID:
A5018878130
CMOS devices and technology for VLSI
1990
·
John Y. Chen
·
61
CMOS — The emerging VLSI technology
1986
·
John Y. Chen
·
IEEE Circuits and Devices Magazine
·
43
GPU technology trends and future requirements
2009
·
John Y. Chen
·
Technical digest - International Electron Devices Meeting/Technical digest
·
42
Scaling CMOS Technologies with Constant Latch-Up Immunity
1986
·
Alan Lewis
, Russel A. Martin
, et al.
·
Symposium on VLSI Technology
·
14
Hot Electron Induced Punchthrough in Submicron PMOSFETs
1986
·
Mitsumasa Koyanagi
, Alan G. Lewis
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
·
6
Transform designs to chips, an end user point of view on mask making
2012
·
John Y. Chen
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
3
PDF
Submicrometer FET gate fabrication using resistless and focused ion beam techniques
1985
·
David B. Rensch
, John Y. Chen
, et al.
·
Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena
·
3
Gain Cell Memory Scalability to 5-nm and Beyond
2025
·
Shuhan Liu
, Koustav Jana
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
·
2
Accelerate lithography improvement for high performance computing
2018
·
John Y. Chen
·
International Conference on Extreme Ultraviolet Lithography
·
2
PDF
Leadership in Management
2022
·
John Y. Chen
·
Nova Science Publishers eBooks
·
1
Current Trends in MOS Process Integration
1989
·
ALAN G. LEWIS
, JOHN Y. CHEN
·
Elsevier eBooks
·
1
Amp Cell: 3D-Scalable Gain Cell Memory with Decoupled Read, Write, and Store
2025
·
Shuhan Liu
, Koustav Jana
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
Innovate VLSI for AI Growth
2025
·
John Y. Chen
·
IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
Latch-Up Elimination in High Density CMOS
1983
·
John Y. Chen
·
Symposium on VLSI Technology
The Use of Electron Beam Annealing to Reduce Contact Resistance for VLSI
1982
·
John Y. Chen
, D.B. Rensch
·
Symposium on VLSI Technology
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Works count:
15
Citation count:
178
H-index:
5
I10-index:
4
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