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David P. Vallett

Observed names: D. P. Vallett, D. Vallett, D.P. Vallett, David Vallett
OpenAlex ID: A5019000106
Picosecond imaging circuit analysis
2000 · J. C. Tsang, J. A. Kash, et al. · IBM Journal of Research and Development · 73
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
2003 · P. Nigh, D. Vallett, et al. · IEEE International Test Conference (ITC) · 53
IC failure analysis: the importance of test and diagnostics
1997 · D.P. Vallett · IEEE Design & Test of Computers · 47
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
2002 · P. Nigh, D. Vallett, et al. · IEEE International Test Conference (ITC) · 39
Time-resolved optical characterization of electrical activity in integrated circuits
2000 · J.C. Tsang, J.A. Kash, et al. · Proceedings of the IEEE · 27
Diagnosis and characterization of timing-related defects by time-dependent light emission
2002 · D. Knebel, P. Sanda, et al. · IEEE International Test Conference (ITC) · 24
Failure analysis requirements for nanoelectronics
2002 · D.P. Vallett · IEEE Transactions on Nanotechnology · 23
Finding fault with deep-submicron ICs
1997 · D.P. Vallett, J.M. Soden · IEEE Spectrum · 17
An overview of CMOS VLSI failure analysis and the importance of test and diagnostics
2002 · D.P. Vallett · IEEE International Test Conference (ITC) · 16
Scanning SQUID Microscopy for Die Level Fault Isolation
2002 · David P. Vallett · Proceedings - International Symposium for Testing and Failure Analysis · 16
Non-Invasive Backside Failure Analysis of Integrated Circuits by Time-Dependent Light Emission: Picosecond Imaging Circuit Analysis
1998 · J.A. Kash, J.C. Tsang, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 16
A Comparison of Lock-in Thermography and Magnetic Current Imaging for Localizing Buried Short-Circuits
2011 · David P. Vallett · Proceedings - International Symposium for Testing and Failure Analysis · 12
Enhanced Comparison of Lock-In Thermography and Magnetic Microscopy for 3D Defect Localization of System in Packages
2012 · Christian Schmidt, Frank Altmann, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 9
Probing the Future of Failure Analysis
2002 · David P. Vallett · EDFA Technical Articles · 8
Why Waste Time on Roadmaps When We Don't Have Cars?
2007 · David P. Vallett · IEEE Transactions on Device and Materials Reliability · 6
Localization of Dead Open in a Solder Bump by Space Domain Reflectometry
2012 · David P. Vallett, Daniel A. Bader, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 5
High-Resolution Backside GMR Magnetic Current Imaging on a Contour-Milled Globally Ultrathin Die
2014 · D. Vallett, J. Gaudestad, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 4
Failure analysis requirements for nanoelectronics
2003 · D.P. Vallett · IEEE Conference on Nanotechnology (IEEE NANO) · 4
FA Future Requirements
1999 · David P. Vallett · Springer eBooks · 4
Magnetic Field Imaging for Non-Destructive 3D Package Fault Isolation
2014 · Jan Gaudestad, David Vallett · IMAPSource Proceedings · 3
Quantitative Analysis and Depth Measurement via Magnetic Field Imaging
2005 · Benaiah D. Schrag, Xiaoyong Liu, et al. · EDFA Technical Articles · 3
From Microns to Molecules – Can FA Remain Viable Through the Next Decade?
2002 · David P. Vallett · Proceedings - International Symposium for Testing and Failure Analysis · 3
Future challenges in IC testing and fault isolation
2004 · D.P. Vallett · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 2
Reliability test failure analysis using advance FA techniques on Cu wire bonded devices
2015 · L. Zhang, T. C. Chai, et al. · IEEE Electronics Packaging Technology Conference (EPTC) · 1
Fault isolation challenges and opportunities for proximal-probe imaging
2012 · D. P. Vallett · IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) · 1
Works count: 28
Citation count: 416
H-index: 12
I10-index: 12
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