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P. Schittenhelm

Observed names: P Schittenhelm, Peter Schittenhelm, Schittenhelm, P.
OpenAlex ID: A5021245527
Growth and characterization of self-assembled Ge-rich islands on Si
1996 · G Abstreiter, P Schittenhelm, et al. · Semiconductor Science and Technology · 196
Photoluminescence study of the crossover from two-dimensional to three-dimensional growth for Ge on Si(100)
1995 · P. Schittenhelm, M. Gail, et al. · Applied Physics Letters · 176
High-resolution x-ray diffraction from multilayered self-assembled Ge dots
1997 · A. A. Darhuber, P. Schittenhelm, et al. · Physical review. B, Condensed matter · 117
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Self-assembled Ge dots: Growth, characterization, ordering, and applications
1998 · P. Schittenhelm, C. Engel, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 76
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Growth of self-assembled homogeneous SiGe-dots on Si(100)
1997 · P. Schittenhelm, G. Abstreiter, et al. · Thin Solid Films · 50
Shape, size, strain and correlations in quantum dot systems studied by grazing incidence X-ray scattering methods
1998 · T.H. Metzger, I. Kegel, et al. · Thin Solid Films · 47
Self-organized MBE growth of Ge-rich SiGe dots on Si(100)
1995 · P. Schittenhelm, M. Gail, et al. · Journal of Crystal Growth · 47
Lateral ordering of coherent Ge islands on Si(001) studied by triple-crystal grazing incidence diffraction
1999 · I. Kegel, T. H. Metzger, et al. · Applied Physics Letters · 35
Local structure of uncapped and Si-capped Ge/Si(100) self-assembled quantum dots
2001 · Alexander V. Kolobov, Hiroyuki Oyanagi, et al. · Applied Physics Letters · 23
SiGe wires and dots grown by local epitaxy
1995 · J. Brunner, P. Schittenhelm, et al. · Journal of Crystal Growth · 23
Space-charge spectroscopy of self-assembled Ge-rich dots on Si grown by MBE
1999 · K. Schmalz, I. N. Yassievich, et al. · Physical review. B, Condensed matter · 19
Self-assembled growth of Sn on Ge (001)
1997 · W. Dondl, P. Schittenhelm, et al. · Thin Solid Films · 11
Structural characterization of self-assembled Ge dot multilayers by X-ray diffraction and reflectivity methods
1998 · A.A Darhuber, V Holy, et al. · Physica E Low-dimensional Systems and Nanostructures · 8
X-ray diffraction and reflection from self-assembled Ge dots
1997 · A A. Darhuber, J Stangl, et al. · Thin Solid Films · 8
Room temperature electroluminescence of Er-implanted silicon diodes grown by MBE
1996 · M. Jaumann, J. Stimmer, et al. · Applied Surface Science · 7
Segregation of n-dopants on SiGe surfaces
1996 · J.F. Nützel, M. Holzmann, et al. · Applied Surface Science · 6
Local epitaxy of Si/SiGe wires and dots
1995 · J. Brunner, W. Jung, et al. · Journal of Crystal Growth · 5
Diffusion Effects and Luminescence in Thin SiGe/Si Layers
1995 · M Gail, W. Jung, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 4
Fabrication and characterization of Si/SiGe nanometer structures
1995 · J. Gondermann, B. Spangenberg, et al. · Microelectronic Engineering · 4
Fabrication and characterisation of locally grown SiGe wires and dots
1995 · J. Gondermann, B. Spangenberg, et al. · Materials Science and Technology · 2
Structural characterization of self-organized Ge islands
2000 · A. A. Darhuber, G. Bauer, et al. · Springer eBooks
Structural characterization of self-assembled Ge-dots by x-ray diffraction and reflection
1997 · Anton A. Darhuber, V. Holý, et al. · TU/e Research Portal
Structural Investigations of Self-Assembled Ge-Dots by X-Ray Diffraction and Reflection
1996 · A.A. Darhuber, V. Holy, et al. · MRS Proceedings
Local epitaxy of Si/SiGe wires and dots
1996 · J. Brunner, W. Jung, et al. · Elsevier eBooks
Self-organized MBE growth of Ge-rich SiGe dots on Si(100)
1996 · P. Schittenhelm, M. Gail, et al. · Elsevier eBooks
Works count: 29
Citation count: 864
H-index: 11
I10-index: 12
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