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Author

Zixiang Guo

Observed name: Guo, Zixiang
ORCID: 0000-0002-8043-1454
Observed ORCID: 0000-0002-8043-1454
OpenAlex ID: A5021880166
Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors
2023 · Zixiang Guo, Kan Li, et al. · IEEE Transactions on Nuclear Science · 17
Total-Ionizing-Dose Effects on Polycrystalline-Si Channel Vertical-Charge-Trapping Nand Devices
2021 · Jingchen Cao, Peng Fei Wang, et al. · IEEE Transactions on Nuclear Science · 12
Design and optimization of LDMOS-SCR devices with improved ESD protection performance
2016 · Hailian Liang, Huafeng Cao, et al. · Microelectronics Reliability · 10
Evaluating the Robustness of Complementary Channel Ferroelectric FETs Against Total Ionizing Dose Toward Radiation-Tolerant Embedded Nonvolatile Memory
2023 · Zhouhang Jiang, Zixiang Guo, et al. · IEEE Electron Device Letters · 5
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Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors With SiO₂ Oxygen-Penetration Layers
2023 · Zixiang Guo, En Xia Zhang, et al. · IEEE Transactions on Nuclear Science · 4
Progressive current degradation and breakdown behavior in GaN LEDs under high reverse bias stress
2017 · Linna Zhao, Peihong Yu, et al. · Chinese Physics B · 1
The Preparation and Properties of Semi-conductive Glaze for Electric Ceramics
2025 · Wentao Niu, Changquan Yang, et al. · Journal of Physics Conference Series
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Works count: 8
Citation count: 49
H-index: 4
I10-index: 3
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