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Martin Eisner

Observed names: Eisner, Martin, M Eisner, M. Eisner, Martin Eisner (3972605)
OpenAlex ID: A5022498387
Design, fabrication and testing of microlens arrays for sensors and microsystems
1997 · Ph Nussbaum, R Völkel, et al. · Pure and Applied Optics Journal of the European Optical Society Part A · 408
Miniaturized imaging systems
2003 · R. Völkel, M. Eisner, et al. · Microelectronic Engineering · 122
Microoptical telescope compound eye
2005 · Jacques Duparré, Peter Schreiber, et al. · Optics Express · 90
Transferring resist microlenses into silicon by reactive ion etching
1996 · Martin Eisner, Johannes Schwider · Optical Engineering · 53
Confocal microscopy with a refractive microlens–pinhole array
1998 · M. Eisner, N. Lindlein, et al. · Optics Letters · 39
Full wafer microlens replication by UV imprint lithography
2009 · H. Schmitt, M. Rommel, et al. · Microelectronic Engineering · 38
Multifunctional micro-optical elements for laser beam homogenizing and beam shaping
2008 · A. Bich, J. Rieck, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 25
High numerical aperture silicon collimating lens for mid-infrared quantum cascade lasers manufactured using wafer-level techniques
2012 · Eric Logean, Lubos Hvozdara, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 14
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Improvements on the uniformity of large-area microlens arrays in Fused Silica
2019 · Raoul Kirner, Jeremy Béguelin, et al. · Optics Express · 11
Wafer Level Cameras – Novel Fabrication and Packaging Technologies
2024 · Margarete Zoberbier, Sven Hansen, et al. · IISS online library · 10
Reactive ion etching of microlens arrays into fused silica
1994 · Stefan Haselbeck, Martin Eisner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10
Fabrication of aspherical microlenses in fused silica and silicon
2001 · Reinhard Voelkel, Martin Eisner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8
Wafer-level micro-optics: trends in manufacturing, testing, and packaging
2011 · Reinhard Voelkel, Kenneth J. Weible, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 7
Flexible beam shaping system using fly’s eye condenser
2010 · Norbert Lindlein, Andreas Bich, et al. · Applied Optics · 7
Micro-optics: manufacturing and characterization
2005 · R. Voelkel, M. Eisner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
Metrology of refractive microlens arrays
2004 · Kenneth J. Weible, Reinhard Volkel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5
Measuring the modulus of the spatial coherence function using an error tolerant phase shifting algorithm and a continuous lateral shearing interferometer
2016 · Irina Harder, Martin Eisner, et al. · Optics Express · 4
Technology trends in the manufacturing and packaging of Wafer Level Cameras
2010 · Ralph Zoberbier, Marc Hennemeyer, et al. · Electronic System-Integration Technology Conference (ESTC) · 3
Refractive micolens arrays for photolithography
2000 · M. Eisner, C. Ossmann, et al. · Diffractive Optics and Micro-Optics · 3
Leveraging wafer-level manufacturing process limitations to increase large-scale fused silica microlens array uniformity
2019 · Raoul Kirner, Jeremy Béguelin, et al. · 2
Fabrication of non-conventional microlens arrays
1995 · R. Völkel, Ph. Nussbaum, et al. · Infoscience (Ecole Polytechnique Fédérale de Lausanne) · 2
Silicon based micro-optical collimating element for mid-infrared Quantum Cascade Lasers
2012 · Lubos Hvozdara, Eric Logean, et al. · Infoscience (Ecole Polytechnique Fédérale de Lausanne)
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Randomly varying micro-optical elements for the generation of uniform intensity profiles in coherent laser sources
2008 · K. J. Weible, A. Bich, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
M imaging systems
2003 · R. Völkel, Martin Eisner
Refractive microlenses for ultraflat photolithographic projection systems
2000 · Reinhard Voelkel, Martin Eisner, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Works count: 33
Citation count: 866
H-index: 10
I10-index: 11
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